Common spring-loaded probe applications

Spring-loaded probes are used across test and connection applications. Common families include ICT/FCT fixture probes, short-travel battery contact probes, pneumatic probes, threaded probes, high-current probes, switching probes and push-back probes.

Fixture and interface probes

ICT/FCT series fixture probes perform standard testing at 50, 75 and 100 mil centres. Short-travel probes are compact parts with limited travel, often used as battery contacts and for the interface between a probe fixture and the test system.

Pneumatic probes provide selective access to a single test point where access is limited. Threaded (screw-mount) probes are threaded for secure installation and are used in wire-controlled test modules.

High-current, switching and push-back probes

High-current probes are designed for high-current applications. Switching probes incorporate integrated switching elements and are used mainly for field testing. Push-back probes verify the sealing seat of a connector element as the connector is pushed back.

Probe categories and SISE products

Probes can be grouped as test probes, semiconductor probes, ICT probes, high-frequency probes, high-current probes and battery contact probes. Dongguan Spring-in-Spring Electronics Co., Ltd. (SISE), established in October 2011 in Dongguan, manufactures spring contact fingers and high-current connector products that support probe and test-fixture applications.