Custom Probes
Custom spring-loaded test probe pins with threaded bases and serrated contact heads, machined to order; silver-plated brass/T2 copper, standard pin sizes 1.58mm; 2.8mm; 3.6mm.
Specifications
- Materials
- BRASS
- Plating
- Silver, Tin
Description
Custom Probes are spring-loaded test probe pins machined to the customer's drawing, with threaded bases that screw into a fixture and serrated contact heads that hold on the pad under spring load. The threaded base lets the probe be set to a repeatable height in a jig, and the serrated head holds position on the test pad so the reading is taken from the same point every time. The photographed collection spans assorted silver and gold plated precision-machined connector pins, sockets and terminals kept in an organizer, which is how these probes are supplied in small custom lots. They are linked to Electric Vehicles, where they are used in charging-terminal and battery-test fixtures.
Custom Machining
Because each probe is machined rather than drawn from a standard catalogue, geometry, plating and material follow the customer's specification. The baseline options are silver plating on brass or T2 copper, and the standard charging pin jack sizes — 1.58mm; 2.8mm; 3.6mm; 3mm; 6mm — apply where a probe must match an existing socket.
Matching Range
Where a probe must land in an existing jack, industry-use connector jacks are supplied from the 1.5/3/5.7/6/8/9.07/10/12/14/15/16/18/20/22mm -28mm size sequence, and individual current levels can be customized according to customer needs. This pairs a test probe with its matching socket in a single order, keeping thread and bore geometry consistent across a bench setup. Shielding springs in 35mm2, 50mm2, 75mm2, 90mm2 are available for quick shielding interfaces in the same test fixtures.
Manufactured by Dongguan SISE (Spring-in-Spring) Electronics Co., Ltd., an ISO 9001 and IATF 16949 certified manufacturer of precision spring contacts, high-current connector terminals and EMI/RFI shielding since 2011.