Spring-loaded probes: testing and contact applications

Spring-loaded probes are used to make contact with the various test points of printed circuit boards (PCBs), components and wiring fields during electrical testing. They form the contact chain between the test system and the point under test on a board or harness.

Testing printed circuit boards

The main probe application is contacting the test points of a printed circuit board — including bare boards and boards with components already fitted — so that the test system can check the circuit.

Testing cables and other applications

When used in special test modules, probes test connecting cable systems. A test probe can also be used to control engineering units or as a charging contact.